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The C2741 is a small lightweight, lightweight, high-performance IR video camera designed for measurement, inspection and image processing in the industrial field. The C2741-03 and 03C has outstanding operational characteristics such as high resolution, low distortion and geometric stability. Designed specifically for measurements and industrial imspection, the C2741-03 and 03C greatly surpasses ordinary surveillance cameras in performance and accuracy, making it the camera of choice for serious IR/Video applications. |
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| C2741-03, 03C - Spectral Response | |||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| Semiconductor Applications | |||||||||||||||||||||||||||||||||||||||||||||||||||||||
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The Hamamatsu C2741-03 and 03C is useful
at many stages in the integrated circuit manufacturing
and quality assurance process, including surface inspections
for scratches, foreign matter and particles. Also, the
system (for infrared use) can be utilized to detect internal
flaws and process problems in silicon and gallium arsenide
wafers. |
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| Defects in a GaAs 2-inch diameter, 3mm thick wafer | Inspection of internal defects | ||||||||||||||||||||||||||||||||||||||||||||||||||||||
| Other Applications | |||||||||||||||||||||||||||||||||||||||||||||||||||||||
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| Lead sulfide IR vidicon tube cameras offer high-resolution,
excellent sensitivity and a large field of view from 400nm
to 1800nm, which includes wavelengths standard CCD cameras
are not capable of detecting. Contrast enhancement functions
increase image contrast and compensate for less than perfect
lighting conditions
Model C2741-03 versus
C2741-03C The C2741-03 has greater resolution and more stringent
shading and defect specifications than the C2741-03C.
The C2741-03 is, therefore, the camera of choice for all
imaging applications other than laser or IR source beam
profiling for which the C2741-03C is the recommended detector. |
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Providing
Thermal Imaging Solutions to Business and Industry |
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